אירועים והרצאות בפקולטה למדעי המחשב ע"ש הנרי ומרילין טאוב
אלכס גולץ (הנדסת חשמל, טכניון)
יום שלישי, 24.06.2014, 11:30
חדר 1061, בניין מאייר, הפקולטה להנדסת חשמל
There is resolution loss that is caused strictly by noise, without the presence of imaging blur. Past studies analyze resolution limits in single channel, pan-chromatic systems. There is a need to generalize this analysis to color cameras. We analyze two main types of color sensors: Bayer sensors, which yield color by a filter array on top of a single detector array, and full-field systems (e.g. 3CCD). Bayer sensors compromise resolution. In order to quantify this inherent loss, we present a model for the spatial frequency response of a Bayer system. Our model deals with a color input signal, and accounts for both sampling and linear demosaicking. For full-field systems, we analyze the probability of resolving details as a function of spatial frequency, under noise. The analysis introduces theoretical bounds for performance. Color sampling indeed enhances the ability to recover objects under noise, given a fixed photon flux. Our framework assess the ability and probability of a color imaging system to distinguish an object of given size, color and SNR.
M.Sc research under the supervision of Prof. Yoav Schechner.